Meyette, E.: search on Z-Library

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1

[IEEE 2011 22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2011.05.16-2011.05.18)] 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Reducing environmentally induced defects while maintaining productivity

van Roijen, R., Conti, S., Keyser, R., Arndt, R., Burda, R., Ayala, J., Henry, R., Levy, J., Maxson, J., Meyette, E., Steer, W., Tabakman, K., Yu, C.

Year:

2011

Language:

english

File:

PDF, 479 KB

english, 2011

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Metrology, Inspection, and Process Control for Microlithography XXIII - Increased uniformity control in a 45nm polysilicon gate etch process

Parkinson, Blake, Allgair, John A., Raymond, Christopher J., Prager, Dan, Funk, Merritt, Sundararajan, Radha, Yamashita, Asao, Bandy, Kenneth, Meyette, Eric

Year:

2009

Language:

english

File:

PDF, 694 KB

english, 2009

3

Costs of Quotidian Home Hemodialysis

A Kroeker, W.F. Clark, A.P. Heidenheim, L. Kuenzig, R. Leitch, R.M. Lindsay, M. Meyette, N. Muirhead, H. Ryan, R. Welch, S. White

Journal:

Hemodialysis International

Year:

2003

Language:

english

File:

PDF, 536 KB

english, 2003

4

An operating cost comparison between conventional and home quotidian hemodialysis

Andrew Kroeker, William F Clark, A.Paul Heidenheim, Louise Kuenzig, Rosemary Leitch, Michael Meyette, Norman Muirhead, Heather Ryan, Randy Welch, Sharon White, Robert M Lindsay

Journal:

American Journal of Kidney Diseases

Year:

2003

Language:

english

File:

PDF, 52 KB

english, 2003

5

[IEEE 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Cambridge, MA, USA (2008.05.5-2008.05.7)] 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Challenges in 65nm Poly, RX and STI Defect Learning

Yu, Chienfan, Ayala, Javier, Tran, Cung, Gay, James, Santiago, Anthony, Meyette, Eric, Hampton, Elizabeth, Oakley, Garrett, Bandy, Kenneth, McCormack, Timothy, Venigalla, Rajasekhar, Scholl, Frederick

Year:

2008

Language:

english

File:

PDF, 1.33 MB

english, 2008

6

[IEEE The 17th Annual SEMI/IEEE ASMC 2006 Conference - Boston, MA (May 22-24, 2006)] The 17th Annual SEMI/IEEE ASMC 2006 Conference - High Volume Manufacturing Ramp In 90nm Dual Stress Liner Technology

Gehres, R., Malik, R., Amos, R., Brown, J., Butt, S., Chan, A., Collins, C., Colwill, B., Davies, B., Gabor, A., Le, N., Lindo, P., Mello, K., Meyette, E., Nastasi, V., Patrick, J., Piper, A., Prakash

Year:

2006

Language:

english

File:

PDF, 881 KB

english, 2006

7

Reducing Environmentally Induced Defects While Maintaining Productivity

van Roijen, Raymond, Conti, Susan G., Keyser, Rebekah, Arndt, Russel, Burda, Richard, Ayala, Javier, Henry, Richard O., Levy, Jonathan, Maxson, Jeffrey, Meyette, Eric, Steer, Warwick, Tabakman, Keith,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2013

Language:

english

File:

PDF, 8.63 MB

english, 2013

8

Letter to the editor

Journal:

American Journal of Hospice and Palliative Medicine

Year:

1995

Language:

english

File:

PDF, 185 KB

english, 1995

9

New Native American Writing || I Wish My Mother Had Named Me Wind

Journal:

Studies in American Indian Literatures

Year:

1990

Language:

english

File:

PDF, 142 KB

english, 1990

10

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Advanced profile control and the impact of sidewall angle at gate etch for critical nodes

Lee, Hyung, Allgair, John A., Raymond, Christopher J., Ranjan, Alok, Prager, Dan, Bandy, Kenneth A., Meyette, Eric, Sundararajan, Radha, Viswanathan, Anita, Yamashita, Asao, Funk, Merritt

Year:

2008

Language:

english

File:

PDF, 654 KB

english, 2008

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